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Accueil du site > Membres > Membres Permanents > Professeurs des Universités > Patrick Gorria

Patrick Gorria

Professeur

IUT LE CREUSOT
LABORATOIRE Le2i
12,rue de la Fonderie
71200 LE CREUSOT

Tél : 03 85 73 10 00
Fax : 03 85 73 10 99
Email : patrick.gorria u-bourgogne.fr

Projets :


Publications

Revues (34)

  • "3D characterization of hot metallic shells during industrial forging", Youssef Bokhabrine, Ralph Seulin, Lew F.C. Lew Yan Voon, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, Journal of Machine Vision and Applications, Springer, Novembre 2010 http://www.springerlink.com/index/69370248633L7N10.pdf
  • "Non-Model Based Method for an Automation of 3D Acquisition and Post-Processing", Benjamin Loriot, Ralph Seulin, Patrick Gorria, Electronics Letters on Computer Vision and Analysis, Vol. 7 (No. 3), pp. 67-82, David Fofi and Ralph Seulin, 22 December 2008 http://elcvia.cvc.uab.es/index.php/elcvia/article/view/192
  • "Development of a chewing simulator for food breakdown and the analysis of in vitro flavor compound release in a mouth environment", Christian Salles, A Tarrega, Patrick Mielle, Jacques Maratray, Patrick Gorria, Joel Liaboeuf, Jean Jacques Liodenot, Journal of Food Engineering, 82 , pp. 189-198, Elsevier, 16 February 2007 Pub_masticateur_JFE_def.pdf
  • "Gabor filtering for features extraction on Complex Images: Application to defect detection on semiconductors", Pierrick Bourgeat, Patrick Gorria, Kenneth Tobin, Fabrice Meriaudeau, The Imaging Science Journal, 54 , pp. 200-210, December 2006 Image_Sciennce_FM.pdf
  • "Polarization imaging for 3D inspection of highly reflective metallic objects", Olivier Morel, Christophe Stolz, Patrick Gorria, Optics and Spectroscopy, 101 (1), pp. 15-21, à paraître 2006
  • "Active Lighting Applied to 3D Reconstruction of Specular Metallic Surfaces by Polarization Imaging", Olivier Morel, Christophe Stolz, Fabrice Meriaudeau, Patrick Gorria, Applied Optics, 45 (17), pp. 4062-4068, June 2006 lien sur HAL ao_morel.pdf
  • "Attitude measurement by artificial vision", Frédéric Truchetet, Olivier Aubreton, Patrick Gorria, Olivier Laligant, Measurement Science and Technology, 17 , pp. 101-110, January 2006 attitude.pdf
  • "Three-dimensional inspection of highly reflective metallic objects by polarization imaging", Olivier Morel, Christophe Stolz, Fabrice Meriaudeau, Patrick Gorria, Electronic Imaging Newsletter, 15 (2), pp. 4, June 2005 http://spie.org/membership/pdfs/ei/ei15-2.pdf
  • "Machine Vision for defect detection on silicon wafers", Fabrice Meriaudeau, Pierrick Bourgeat, Patrick Gorria, Kenneth Tobin, Holography, news letter, 16 (1), pp. 10-12, SPIE, June 2005
  • "Machine Vision for Defect Detection on Silicon Wafers", Fabrice Meriaudeau, Pierrick Bourgeat, Patrick Gorria, Kenneth Tobin, Electronic Imaging News Letter, 15 (2), pp. 3, May 2005
  • "Merging system for multiscale edge detection", Olivier Laligant, Frédéric Truchetet, Johel Miteran, Patrick Gorria, Optical Engineering, 44 (3), pp. 1-11, March 2005 opt-eng-44-2005.pdf
  • "Patterned wafer segmentation", Pierrick Bourgeat, Fabrice Meriaudeau, Kenneth Tobin, Patrick Gorria, Journal of Electronic Imaging Special Issue on Quality Control by Artificial Vision, 13 (3), pp. 428-435, August 2004 BourgeatJEI2004.pdf
  • "Retina for pattern matching in standard 0.6um Complementary Metal Oxide Semiconductor technology", Olivier Aubreton, Benaissa Bellach, Lew F.C. Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Journal of Electronic Imaging - Special Issue on Quality Control by Artificial Vision, 13 (3), pp. 559-569, SPIE, July 2004
  • "Pattern Wafer segmentation", Pierrick Bourgeat, Fabrice Meriaudeau, Kenneth Tobin, Patrick Gorria, SME Technical Paper, MV03-242, June 2003
  • "Simulation of specular surface imaging based on computer graphics : application on a vision inspection system", Ralph Seulin, Frédéric Merienne, Patrick Gorria, Journal of Applied Signal Processing - Special issue on Applied Visual Inspection, 2002 (7), pp. 649-658, EURASIP, July 2002 seu02.pdf
  • "100-x100- Pixel CMOS Retina for Real-Time Binary Pattern Matching", Lew F.C. Lew Yan Voon, Guy Cathébras, Bernard Lamalle, Patrick Gorria, Benaissa Bellach, Olivier Aubreton, Optical Engineering Letters, 41 (5), pp. 924-925, SPIE, May 2002 2002_oe_final_version.pdf
  • "Discontinuity detection on industrial parts: real time image segmentation using parzen's kernel", Johel Miteran, Sophie Kohler, Pierre Geveaux, Patrick Gorria, Jiri Matas, Materials Evaluation, 60 (3), pp. 430-436, March 2002 miteran_mev.pdf
  • "Active infrared non destructive testing for glue occlusion detection within plastic lids", Anne-claire Legrand, Fabrice Meriaudeau, Patrick Gorria, Journal of NDT&E International, 35 (3), pp. 177-187, January 2002 mer2002c.pdf
  • "Vision system for defect imaging, detection and characterization on a specular surface of 3D object", Denis Aluze, Frédéric Merienne, Christophe Dumont, Patrick Gorria, Image and Vision Computing, 20 , pp. 569-580, Elsevier Science, January 2002
  • "Optical correlation allows silicon retinas to recognize patterns stored in memory", Lew F.C. Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Benaissa Bellach, Fabrice Meriaudeau, David Navarro, Optical Engineering Magazine SPIE, 1 (7), pp. 32-32, July 2001
  • "Machine vision systems in metallurgy industry", Anne-claire Legrand, Eric Renier, Pierre Suzeau, Frédéric Truchetet, Patrick Gorria, Fabrice Meriaudeau, Journal of Electronic Imaging SPIE, 10 (1), pp. 274-282, January 2001 mer2000f.pdf
  • "Study of the imaging conditions and processing for the aspect control of specular surfaces", Gaëtan Delcroix, Ralph Seulin, Bernard Lamalle, Patrick Gorria, Frédéric Merienne, Journal of Electronic Imaging, 10 (1), pp. 196-202, SPIE, January 2001
  • "Defect detection in Plastic lids by active infrared thermography", Fabrice Meriaudeau, Louis Legrand, Patrick Gorria, Electronic Imaging NewsLetter, 11 (1), pp. 3-7, December 2000 mer2000e.pdf
  • "A system for on line monitoring of pulsed laser welding processes", Stéphane Charton, Yvon Voisin, Patrick Gorria, Thierry Vauzelle, Journal of laser applications, 12 (2), pp. 47-53, American institute of physics, April 2000
  • "Classification temps réel pour le contrôle par vision artificielle", Patrick Gorria, Johel Miteran, Bernard Lamalle, Image numérique et perception artificielle. Moroccan journal of control computer science and signal , pp. 1-10, Amadeia, March 2000
  • "Dimensional control of metallic objects by artificial vision", Bernard Lamalle, Sophie Kohler, Patrick Gorria, Claudine Coulot, Optical Engineering, 38 (8), pp. 1305-1311, August 1999
  • "On-Line defects localization on mirror like surfaces", Gaëtan Delcroix, Frédéric Merienne, Bernard Lamalle, Patrick Gorria, Electronic Imaging IS&T SPIE, 9 (2), pp. 2-2, May 1999
  • "Machine vision for the control of reflecting non-plane surfaces", Denis Aluze, Claudine Coulot, Fabrice Meriaudeau, Patrick Gorria, Christophe Dumont, Journal of machine vision association of manufacturing engineers, 14 (3), pp. 1-4, September 1998
  • "Automatic surface inspection of metal tubes by artficial vision", Frédéric Truchetet, Hafid Jender, Patrick Gorria, Michel Paindavoine, Phu-An Ngo, Journal of materials evaluation, 55 (4), pp. 497-503, April 1997
  • "Classification géométrique par polytopes de contraintes, intégration et performances", Johel Miteran, Patrick Gorria, Michel Robert, Traitement du signal, 11 (5), pp. 393-408, March 1995
  • "Controle par vision artficielle de produits en défilement continu", Frédéric Truchetet, Hafid Jender, Patrick Gorria, Michel Paindavoine, Traitement du signal, 11 (2), pp. 171-178, Septembre 1994
  • "Architectures for integration of real time image processing systems", Michel Robert, Michel Paindavoine, Patrick Gorria, IEEE Vlsi Signal Processing, pp. 267-276, Kung Yao, October 1992
  • "Visualisation des modes d'un laser Yag de puissance", Dominique Grevey, Frédéric Badawi, Patrick Gorria, Michel Paindavoine, Journal de physique III, 6 , pp. 1181-1188, Juin 1991
  • "Méthodologie de caractérisation d'un faisceau laser de puissance par traitement d'images", Frédéric Badawi, T Manderscheid, Patrick Gorria, Revue de physique appliquée, 25 , pp. 313-321, Mars 1990

Brevets (7)

  • "Eclairage sectorisé pour la reconstruction tridimensionnelle par imagerie polarimétrique", Olivier Morel, Christophe Stolz, Patrick Gorria, Ralph Seulin, 05.11674 , 17 Novembre 2005
  • "Dispositif d'intercorrélation d'une image", Patrick Gorria, Bernard Lamalle, Guy Cathébras, Patent #99.00008 (Européen), pp. 1-10, Janvier 1999
  • "Dispositif de détection de défauts de surface sur des pièces réfléchissantes", Patrick Gorria, Denis Aluze, Gaëtan Delcroix, Frédéric Merienne, Bernard Lamalle, Christophe Dumont, Patent #98-14417 (Européen), pp. 1-7, Juin 1998
  • "Dispositif et procédé de détection au défilé de défauts de surface sur des produits longs métalliques", Patrick Gorria, Hafid Jender, Michel Paindavoine, Frédéric Truchetet, Pascal Gérard, Phu-An Ngo, Patent #92-06987 (Européen), Juin 1992
  • "Temporisattion électronique de réseau électrique", Patrick Gorria, François Costa, Patent #89-02748 (Médaille de bronze au 17° salon international des inventions de Geneve), Février 1989
  • "Pulsmètre podomètre microprogrammé", Patrick Gorria, Jérome Bernier, Patent #85-09094 (Sélection de l'enjeu de l'innovation de F. de Closets), Avril 1985
  • "Régulation de tension et de fréquence sur des génératrices asynchrones", Patrick Gorria, Dominique Laurent, Patent #84-11866 , Juillet 1984

Conférences internationales (84)

  • "3D dimensional measurement of large hot metallic shells", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, Proceedings of QCAV 2009, Austria, 27 May 2009
  • "A simulation of automatic 3D acquisition and post-processing pipeline", Arsalan Malik, Benjamin Loriot, Youssef Bokhabrine, Patrick Gorria, Ralph Seulin, Proceedings of SPIE, Electronic Imaging Machine Vision Application, San Jose, California, USA, January 2009 2279_paper_spie.pdf
  • "3D reconstruction of hot metallic surfaces for industrial part characterization ", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Miguel Gomez, Daniel Jobard, Proceedings of SPIE - Electronic Imaging 2009, 7251 , San Jose, USA, SPIE, 2009 2289_IE2009_yb.pdf
  • "Projector View Synthesis and Virtual Texturing", Thierry Molinier, David Fofi, Joaquim Salvi, Patrick Gorria, Fabrice Meriaudeau, The 2nd International Topical Meeting on Optical Sensing and Artificial Vision, Saint-Petersburg, Russia, May 2008
  • "2D Virtual Texture on 3D Real Object with Coded Structured Light", Thierry Molinier, David Fofi, Joaquim Salvi, Patrick Gorria, SPIE Electronic Imaging - Image Processing: Machine Vision Applications, January 2008
  • "3D LASER SYSTEM FOR SHELL DIMENSION MEASUREMENT DURING FORGING", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Miguel Gomez, Philippe Tollini, Daniel Jobard, International Forgemasters Meeting (IFM), pp. 345-348, SANTANDER, SPAIN, 2008
  • "Detection of Surfaces for Projection of Texture", Thierry Molinier, David Fofi, Patrick Gorria, Joaquim Salvi, IEEE/SPIE 8th International Conference on Quality Control by Artificial Vision (QCAV'2007), Le Creusot , France, May 2007
  • "Active lighting applied to shape from polarization", Olivier Morel, Mathias Ferraton, Christophe Stolz, Patrick Gorria, International Conference on Image Processing, pp. 2181-2184, Atlanta, USA, IEEE, 20 February 2007 http://dx.doi.org/10.1109/ICIP.2006.312877
  • "Toward an automation of 3D acquisition and post-processing of cultural heritage artefacts", Benjamin Loriot, Ralph Seulin, Patrick Gorria, Proceedings of SPIE, Electronic Imaging Machine Vision Application, Vol. 6503 (65030B), San Jose, California, USA, Fabrice Meriaudeau, Kurt S. Niel, Editors, 17 February 2007
  • "Simulation for an Automation of 3D Acquisition and Post-Processing", Benjamin Loriot, Ralph Seulin, Patrick Gorria, Fabrice Meriaudeau, Proceedings of SPIE, 8th International Conference on Quality Control by Artificial Vision (QCAV'2007), Vol. 6356 (635604), Le Creusot, France, David Fofi, Fabrice Meriaudeau, Editors, May 2007 1809_QCAV_submission.pdf
  • "Novel View Synthesis for Projective Texture Mapping on Real 3D Objects", Thierry Molinier, David Fofi, Patrick Gorria, SPIE Electronic Imaging - Machine Vision Applications in Industrial Inspection XIV, San José, USA, January 2006 molinier_spie_2006.pdf
  • "A novel prototype to closely mimic mastication for in vitro dynamic measurements of flavour release", Christian Salles, Patrick Mielle, Jean Luc Le Quéré, Raoul Renaud, Jacques Maratray, Patrick Gorria, Joel Liaboeuf, Jean Jacques Liodenot, Weurman Flavour Research Symposium, Roskilde, Denmark, 21 June 2005
  • "Classifier Combination on Features extracted from Complex Images : Application to Defect Detection on Silicon Wafers", Fabrice Meriaudeau, Pierrick Bourgeat, Patrick Gorria, Kenneth Tobin, QCAV'2005, Nagoya, Japan, 18 May 2005
  • "An "Artificial Mouth" as a novel sampling device for E-Nose, E-Tongue and APCI-MS", Patrick Mielle, Raoul Renaud, Patrick Gorria, Jean Jacques Liodenot, Joel Liaboeuf, Christian Salles, Elisabeth Guichard, 11st International Symposium Olfaction & Electronic Noses ISOEN'2005, Bercelone, Spain, 13 April 2005
  • "Polarization imaging applied to 3D inspection of specular metallic surfaces", Olivier Morel, Fabrice Meriaudeau, Christophe Stolz, Patrick Gorria, Machine Vision Applications in Industrial Inspection XIII, 5679 , pp. 178-186, San Jose, California, SPIE, 18 January 2005 morel05.pdf
  • "Gabor filters applied to pattern wafers segmentation", Pierrick Bourgeat, Fabrice Meriaudeau, Patrick Gorria, Kenneth Tobin, Proceedings of the SPIE conference, "Wavelet application in industrial processing II", 5607 , Philadelphia, USA, F. Truchetet, O. Laligant, 27 October 2004
  • "Features extraction on complex images", Pierrick Bourgeat, Fabrice Meriaudeau, Patrick Gorria, Kenneth Tobin, Proceedings of the conference "Optical Sensing and Artificial Vision 2004", Saint Petersburg, Russia, 18 October 2004
  • "Polarization applied to 3D reconstruction of highly reflective metallic objetcs", Olivier Morel, Christophe Stolz, Patrick Gorria, Optical Sensing and Artificial Vision, Saint Petersburg, Russia, Octobre 2004
  • "Features extraction on complex images", Pierrick Bourgeat, Fabrice Meriaudeau, Patrick Gorria, Kenneth Tobin, Frédéric Truchetet, ICIP’2004, Singapour, 24-27 Octobre 2004 BourgeatICIP2004.pdf
  • "Application of Polarimetric Imaging to 3D Inspection of Highly Reflective Metallic Surfaces", Olivier Morel, Christophe Stolz, Patrick Gorria, Optics East: Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, 5606 , pp. 82-89, Philadelphia , SPIE, 2004
  • "Comparison of texture features for segmentation of patterned wafers", Pierrick Bourgeat, Fabrice Meriaudeau, Kenneth Tobin, Patrick Gorria, Proc. SPIE, Wavelet Applications in Industrial Processing , 5266 , pp. 179-190, Providence, RI, USA, SPIE, October 2003
  • "A Correlation Retina in Standard 0.6um: Application in positioning system", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Patrick Gorria, Benaissa Bellach, 2003 International Conference on Quality Control by Artificial Vision - QCAV'2003, Proc. of SPIE, Vol. 5132 , pp. 112-119, Gatlinburg, Tennessee, USA., SPIE, May 2003 qcav03.pdf
  • "Pattern Wafer Segmentation", Pierrick Bourgeat, Fabrice Meriaudeau, Kenneth Tobin, Patrick Gorria, Actes du colloque QCAV'2003, SPIE, 5132 , pp. 36-44, Gatlinburg, USA, Tobin K, Meriaudeau F, May 2003
  • "Content based segmentation of patterned wafer for automatic threshold determination ", Pierrick Bourgeat, Fabrice Meriaudeau, Kenneth Tobin, Patrick Gorria, Proc. SPIE, Machine Vision Application in Industrial Inspection XI, 5011 , pp. 183-189, Santa-Calra, USA, January 2003 mer2003a.pdf
  • "Real-time multispectral high-temperature measurement: application to control in the industry", Fabrice Meriaudeau, Anne-claire Legrand, Patrick Gorria, Machine Vision Applications in Industrial Inspection XI, 5011 , pp. 234-242, January 2003
  • "A Continuous Time Pattern Recognition Retina", Guy Cathébras, David Navarro, Olivier Aubreton, Benaissa Bellach, Patrick Gorria, Bernard Lamalle, Lew F.C. Lew Yan Voon, Proceedings of the 28th IEEE European Solid-State Circuits Conference - ESSCIRC'02, pp. 719-722, Florence, Italy, Septembre 2002
  • "Crack defect detection and localization using genetic based inverse voting Hough transform", Khalil Maalmi, Aziza El Ouaazizi, Rachid Benslimane, Lew F.C. Lew Yan Voon, Alain Diou, Patrick Gorria, CDROM Proceedings of 2002 International Conference on Pattern Recognition - ICPR'2002, Québec city, Québec, Canada, August 2002
  • "Detecting parabolas in ultrasound B-scan images with genetic-based inverse voting Hough transform", Khalil Maalmi, Aziza El Ouaazizi, Rachid Benslimane, Lew F.C. Lew Yan Voon, Alain Diou, Patrick Gorria, Proceedings of ICASSP'2002, IV , pp. 3337-3340, Orlando, Florida, USA, May 2002 ICASSP2002_us_1738.pdf
  • "A Pattern Recognition System based on a 100x100 Pixels Retina Fabricated in Standard 0.6 micron CMOS Technology", Olivier Aubreton, Benaissa Bellach, Guy Cathébras, Patrick Gorria, Bernard Lamalle, Lew F.C. Lew Yan Voon, Proceedings of Design, Automation and Test in Europe - DATE'2002: Designer's Forum, pp. 272-272, France, 4 March 2002
  • "Defect detection and classification on metallic part", Pierrick Bourgeat, Fabrice Meriaudeau, Patrick Gorria, Proc. SPIE Machine vision on Industrial Inspection X, 4664 , pp. 182-189, San-Jose, USA, January 2002 merspie2002.pdf
  • "Simulation process for the design and optimization of a machine vision system for specular surface inspection", Ralph Seulin, Nicolas Bonnot, Frédéric Merienne, Patrick Gorria, Conference on Machine Vision and Three-Dimensional Imaging Systems for Inpection and Metrology II, 4567 , pp. 129-140, Boston, USA, SPIE, October 2001 seu01c.pdf
  • "A Correlation Retina for Real-Time Pattern Recognition", Bernard Lamalle, Guy Cathébras, Lew F.C. Lew Yan Voon, Patrick Gorria, Benaissa Bellach, Olivier Aubreton, Proceedings of the 2001 8th IEEE International Conference on Emerging Technologies and Factory Automation – EFTA'2001, 2 , pp. 367-372, Juan les Pins, France, Octobre 2001
  • "Optimizing the factorisation of 2D filters by genetic algorithm", Eric Fauvet, Lew F.C. Lew Yan Voon, Frédéric Nicolier, Patrick Gorria, Frédéric Truchetet, Proceedings of 2001 International IASTED Conference - Visualization, Imaging and Image Processing – VIIP'2001, pp. 676-681, Spain, September 2001
  • "Infrared vsion system for glue detection in plastic lids", Anne-claire Legrand, Patrick Gorria, Fabrice Meriaudeau, Proceedings of the conference Inframation, pp. 210, Orlando, USA, September 2001
  • "Machine vision system for specular surface inspection: use of simulation process as a tool for design and optimization", Ralph Seulin, Frédéric Merienne, Patrick Gorria, International Conference on Quality Control by Artificial Vision, 1 , pp. 147-152, Le Creusot , France, May 2001 seu01b.pdf
  • "Glue presence detected by Active Infrared Thermography", Anne-claire Legrand, Fabrice Meriaudeau, Patrick Gorria, Colloque QCAV2001/IEEE, pp. 54-59, Le Creusot, France, Mai 2001
  • "Real-Time Pattern Recognition Retina in CMOS Technology", Lew F.C. Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Benaissa Bellach, David Navarro, Proceedings of the 2001 International Conference on Quality Control by Artificial Vision - QCAV'2001, 1 , pp. 238-242, Le Creusot, France, Mai 2001
  • "Silicon Retina for Real-Time Pattern Recognition", Lew F.C. Lew Yan Voon, Guy Cathébras, Benaissa Bellach, Bernard Lamalle, Patrick Gorria, Proceedings of SPIE – Electronic Imaging 2001, Sensors, Cameras, and Systems for Scientific/Industrial Applications III, 4306 , pp. 168-177, San Jose, California, USA, January 2001
  • "Dynamic lighting system for specular surface inspection", Ralph Seulin, Frédéric Merienne, Patrick Gorria, Conference on Machine Vision Applications in Industrial Inspection VII, 4301 , pp. 199-206, San José , USA, SPIE, January 2001 seu01a.pdf
  • "Caractérisation quantitative de couleurs structurales méthode de mesure et application à un carabe forestier", Bruno David, Stéphane Garnier, Paul Alibert, Patrick Gorria, Frédéric Truchetet, Symposium de morphométrie, Paris, France, Janvier 2001
  • "Infrared vision system for glue detection in plastic lids", Anne-claire Legrand, Patrick Gorria, Fabrice Meriaudeau, Proceedings of InfraMation 2001. The Thermographers Conference, 1 , pp. 205-210, Orlando, USA, September 2000
  • "Active infrared nondestructive testing for glue occlusion detection in plastic cap", Anne-claire Legrand, Patrick Gorria, Fabrice Meriaudeau, Knowledge Based Intelligent, Engineering Systems KES’2000, pp. 381-384, Brighton, UK, August 2000
  • "The Study and Design of a Programmable Silicon Retina for Real-Time Pattern Recognition", Bernard Lamalle, Patrick Gorria, Lew F.C. Lew Yan Voon, Guy Cathébras, Proceedings of SPIE/EOS Symposium on Applied Photonics - EUROPTO'2000, Optical Diagnostics for Industrial Applications, 4076 , pp. 225-234, Glasgow, Scotland, UK, May 2000
  • "Classification temps réel pour le contrôle par vision artificielle", Patrick Gorria, Johel Miteran, Bernard Lamalle, Conf. invitée International symposium on image and video.ISIVC Communication over fixed and mobile networks. , pp. 161-169, Rabat, Maroc, April 2000
  • "Contrôle d'Aspect en Ligne de la Métallisation de Pièces 3D.", Gaëtan Delcroix, Bernard Lamalle, Patrick Gorria, Vision Interface 2000, pp. 395-399, Monteal, Canada, Avril 2000
  • "Bispectral temperature measurements in steel industry", Anne-claire Legrand, Fabrice Meriaudeau, Patrick Gorria, Proc. of Conference Annuelle des mettalurgistes, pp. 317-329, Montreal, Canada, August 1999
  • "Dual wavelength Infrared thermography with CCD devices", Anne-claire Legrand, Fabrice Meriaudeau, Pierre Suzeau, Henri Andrzewski, Patrick Gorria, Proc. of QCAV'99, pp. 43-48, Trois-Rivieres, Canada, May 1999
  • "On-line defects localization on mirror like surfaces", Gaëtan Delcroix, Denis Aluze, Frédéric Merienne, Bernard Lamalle, Patrick Gorria, SPIE Machine vision apllications in industrial inspection VII, 3652 , pp. 34-42, San Jose, USA, January 1999
  • "On-line defects detection system", Gaëtan Delcroix, Frédéric Merienne, Bernard Lamalle, Patrick Gorria, QCAV'99, pp. 341-341, Trois rivière, Canada, January 1999
  • "On line control of pulsed Nd : YAG Laser Welds ", Stéphane Charton, Patrick Gorria, Yvon Voisin, Thierry Vauzelle, QCAV98, pp. 476-479, Kagawa, Japon, November 1998
  • "On line Control Of Nd :YAG pulsed Laser Welds ", Stéphane Charton, Yvon Voisin, Patrick Gorria, Thierry Vauzelle, 17 th International congress on applications of lasers and electro-optics (ICALEO 98), pp. 208-215, Orlando, USA, November 1998
  • "Application of Digital Image Processing Techniques in Ultrasonic Inspection of Engineering Structures", Lew F.C. Lew Yan Voon, Patrice Bolland, Patrick Gorria, Eric Renier, Frédéric Truchetet, Bruno Gremillet, Luc Pillet, Proceedings of the 1998 International Conference on Quality Control by Artificial Vision - QCAV'98, pp. 521-528, Takamatsu, Kagawa, Japan, November 1998
  • "On-line aspect control of mirror like surfaces", Gaëtan Delcroix, Denis Aluze, Frédéric Merienne, Bernard Lamalle, Patrick Gorria, QCAV'98, pp. 266-271, Takamatsu Kagawa, Japan, November 1998
  • "Machine vision for controlling reflective 3D objects", Denis Aluze, Christophe Dumont, Patrick Gorria, Mongi Abidi, Society of manufacturing enginneers, Applied machine vision, pp. 45-62, Nashville, USA, May 1998
  • "Defect detection on hightly reflective products", Denis Aluze, Gaëtan Delcroix, Frédéric Merienne, Christophe Dumont, Patrick Gorria, TSVVA'98 International symposium on image processing and artificial vision systems, pp. 41-51, Oujda, Maroc, April 1998
  • "Machine vision for the control of reflecting non plane surfaces", Denis Aluze, Claudine Coulot, Fabrice Meriaudeau, Patrick Gorria, Christophe Dumont, SPIE, Machine vision application in inspection, pp. 15-17, Pittsburg, USA, October 1997
  • "Real time defect detection using iame segmentation", Johel Miteran, Rémy Bailly, Patrick Gorria, ISIE'97, pp. 713-716, Guimares, Portugal, July 1997
  • "Gradient based discrete Hough Transform for the detection and localization of defects during Non-Destructive inspection", Patrice Bolland, Lew F.C. Lew Yan Voon, Patrick Gorria, Bruno Gremillet, Luc Pillet, CD-ROM Proceedings of the 1997 Advanced Intelligent Mechatronics - AIM'97, Tokyo, Japan, June 1997
  • "Gradient based discrete Hough Transform for the detection and localization of defects during Non-Destructive inspection", Patrice Bolland, Lew F.C. Lew Yan Voon, Patrick Gorria, Bruno Gremillet, Luc Pillet, Proceedings of the 1997 International Conference on Quality Control by Artificial Vision - QCAV'97, pp. 287-292, France, May 1997
  • "Classification board for real time image segmentation", Johel Miteran, Rémy Bailly, Patrick Gorria, ICASSSP'97, pp. 4069-4072, Munich, April 1997
  • "Gradient based Discrete Hough Transform for the Detection and Localization of Defects during Non-Destructive Inspection", Lew F.C. Lew Yan Voon, Patrice Bolland, Olivier Laligant, Patrick Gorria, Bruno Gremillet, Luc Pillet, Proceedings of the 1997 IS&T/SPIE Symposium on Electronic Imaging: Science and Technology - Image Processing Methods - Machine Vision Applications in Industrial Inspection, 3029 , pp. 140-146, San Jose, California, USA, February 1997
  • "Real time image segmentation using FPGA and parallel processor", Johel Miteran, Rémy Bailly, Patrick Gorria, TENCON'96, pp. 233-236, Australie, November 1996
  • "The application of hough transform on ultrasonic images for the detection and characterization of defects in nondestructive inspection", Patrice Bolland, Lew F.C. Lew Yan Voon, Alain Diou, Patrick Gorria, ICSP'96, IEEE third int. conf. on Signal Processing, pp. 393-396, Bengin, Chine, October 1996
  • "Thermo-mechanical approach of hot cracking in an austenitic stainless steel", S Lhospitalier, P Bourges, A Bert, Patrick Gorria, Christophe Dumont, ECRS4 Fourth European Conference on Residual Stresses, pp. 4-6, Cluny, France, June 1996
  • "Human detection with a video surveillance system", Eric Goujou, Johel Miteran, Olivier Laligant, Frédéric Truchetet, Patrick Gorria, IECON'95, pp. 1179-1184, Orlando, Floride, November 1995
  • "A neural network approach to geometrical classification by stress polytopes", Patrice Bolland, Johel Miteran, Lew F.C. Lew Yan Voon, Patrick Gorria, QCAV'95, pp. 134-140, Le Creusot, May 1995
  • "Simulation of an optical sensor in Cmos technology", Bernard Lamalle, Patrick Gorria, Lew F.C. Lew Yan Voon, Eric Goujou, QCAV'95, pp. 293-299, Le Creusot, May 1995
  • "Study and realization of Asic Cmos array sensor with controled exposure time", Eric Goujou, Patrick Gorria, Michel Robert, Guy Cathébras, Congrès Franco-Japonais Mecatronics Takamatsu, pp. 326-329, Kagawa, Japan, November 1994
  • "Study and characterization of photosensitive cells in Asics", Eric Goujou, Patrick Gorria, Eric Fauvet, Michel Robert, Guy Cathébras, IECON'94 IEEE, pp. 911-914, Bologne, Italie, September 1994
  • "Characterization of welded area by learning and image processing", Johel Miteran, Patrick Gorria, A Laggoune, Michel Paindavoine, IECON'94 IEEE, pp. 1271-1274, Bologne, Italy, September 1994
  • "The study of a photosite for snapshot video", Mourad Elloumi, Eric Fauvet, Eric Goujou, Patrick Gorria, Guy Cathébras, ICHSPP'94, pp. 259-267, Taejon, Korea, September 1994
  • "Study and characterization of photosensive cells in ASICs", Eric Goujou, Patrick Gorria, Eric Fauvet, Michel Robert, Guy Cathébras, IECON'94, BOLOGNE, September 1994
  • "Architectures for a real time classification processor", Michel Robert, Patrick Gorria, Johel Miteran, Sandra Turgis, CICC IEEE , pp. 197-200, San Diego California, USA, May 1994
  • "Contrôle dimensionnel de bains fondus par traitements d'images", Johel Miteran, Patrick Gorria, Henri Andrzewski, A Laggoune, OPTO'94, pp. 449-454, Paris, France, April 1994
  • "Parallel processor for image segmentation", Johel Miteran, Patrick Gorria, Michel Robert, IEEE MELECON'94, pp. 344-346, Antalya, Turkey, April 1994
  • "Design of real time geometric classifier", Michel Robert, Patrick Gorria, Johel Miteran, Sandra Turgis, EDAC Euroasic, pp. 656-656, Paris, France, March 1994
  • "Asic de segmentation d'images en temps réel par apprentissage", Johel Miteran, Patrick Gorria, Michel Robert, GRETSI'93, pp. 1071-1073, Juan les Pins, France, September 1993
  • "Use snapshot video and real time analysis for defects detection", Frédéric Truchetet, Patrick Gorria, Michel Paindavoine, Michel Robert, 20th International Congress of Hight Speed Photonics, pp. 729-738, Victoria, USA, September 1992
  • "An edge detection Asic for real time defect detection", Michel Robert, Michel Paindavoine, Patrick Gorria, IEEE ASIC and VLSI Conference and Exhibit, pp. 193-196, New York, USA, September 1992
  • "Precharacterized circuit for geometric classification", Patrick Gorria, Michel Paindavoine, Frédéric Truchetet, Hafid Jender, Michel Robert, Annual meeting Classification Society of North Americas, Michigan State University, Lansing, USA, June 1992
  • "Modelisation spatio-temporelle de faisceau laser de puissance", Johel Miteran, Patrick Gorria, Dominique Grevey, Symposium on optoelectronics OPTO'92, pp. 526-530, Paris, France, April 1992
  • "Design of a parallel processor for image classification", Michel Paindavoine, Patrick Gorria, Michel Robert, Workshop COST'229 massively parallel computing, pp. 9-17, Lausanne, Suisse, March 1992
  • "Determination of an optimum attribute vector for image classification and geometrical methods", Yahya Gour, Hafid Jender, Patrick Gorria, Frédéric Truchetet, IEEE Seventh Workshop Lake Placid, pp. 9-17, New York, USA, September 1991
  • "Main characteristics of a high power laser beam", Frédéric Badawi, T Manderscheid, Patrick Gorria, Power Beam Technology Workshop, pp. 28-36, Stratford upon Avon , UK, September 1990

Conférences nationales (43)

  • "Projection de Texture sur des Objets 3D Réels", Thierry Molinier, David Fofi, Patrick Gorria, Joaquim Salvi, Fabrice Meriaudeau, Colloque du Groupe de Recherche sur le Traitement du Signal et des Images (GRETSI), Troyes, France, Septembre 2007 MolinierGRETSI2007.pdf
  • "Reconstruction 3D d'objets transparents par images de polarisation", Mathias Ferraton, Christophe Stolz, Olivier Morel, Fabrice Meriaudeau, Patrick Gorria, Méthodes et Techniques Optiques pour l'Industrie, pp. 128, Mulhouse, SFO, Novembre 2006
  • "Application du 3D au Patrimoine Ecrit", Benjamin Loriot, Ralph Seulin, Patrick Gorria, Pierre Jobard, Journée Signal Image et Arts, GDR Isis, Paris, France, 2006 1563_Application du 3D au patrimoine ecrit.pdf
  • "Application de l'imagerie polarimétrique à l'inspection de surfaces métalliques fortement réfléchissantes", Moyens Optiques pour l'Industrie", Olivier Morel, Christophe Stolz, Patrick Gorria, Méthodes et techniques optiques pour l'industrie, pp. 264-270, Saint Etienne, SFO, 15 Novembre 2004
  • "Eclairage structuré et vision active pour le contrôle qualité de surfaces métalliques réfléchissantes", Olivier Morel, Ralph Seulin, Christophe Stolz, Patrick Gorria, J3eA - hors-série, spécial journée "Eclairage Structuré pour la Vision Active", Club EEA & GdR ISIS, France, 27 Mai 2004 grd_franges04_morel.pdf
  • "Segmentation d'images de semiconducteur pour la détection de défauts", Pierrick Bourgeat, Fabrice Meriaudeau, Kenneth Tobin, Patrick Gorria, GRETSI'2003, Paris, France, Télécom-Paris, Septembre 2003 bour2003.pdf
  • "Analyse du Temps d'Oxydation de Tubes Métalliques par Polytopes de Contraintes dans l'Espace Couleur", David Fofi, Patrick Gorria, Ecole de Printemps Images Numériques Couleur, pp. 152-158, Dijon, France, Mars 2003
  • "Atelier: centre de TechnoVision", Patrick Gorria, Pierre Suzeau, Bernard Lartaud, CNR'IUT 2002, 2 , pp. 691-694, Le Creusot, Mai 2002
  • "Traitement d'images: La solution rétines CMOS", Olivier Aubreton, Benaissa Bellach, Bernard Lamalle, Guy Cathébras, Patrick Gorria, Lew F.C. Lew Yan Voon, Actes de CNRIUT'2002, pp. 71-76, France, Avril 2002
  • "Rétine vidéo rapide réalisée en technologie CMOS", Benaissa Bellach, Olivier Aubreton, Bernard Lamalle, Lew F.C. Lew Yan Voon, Guy Cathébras, Patrick Gorria, Proceedings of 2002 Journées Nationales du Réseau Doctoral de Microélectronique - JNRDM'2002, pp. 211-212, France, Avril 2002
  • "Présentation du centre de TechnoVision", Patrick Gorria, Pierre Suzeau, Bernard Lartaud, CETSIS-EEA 2001, pp. 181-182, Clermont Ferrand II, Octobre 2001
  • "Système de contrôle et de décision par thermographie active infrarouge: Application à la détection d'occlusions de colle à l'intérieur de bouchons plastiques", Anne-claire Legrand, Fabrice Meriaudeau, Patrick Gorria, Actes du colloque GRETSI'2001, Toulouse, France, Septembre 2001
  • "Reconnaissance de formes en temps réel", Patrick Gorria, Bernard Lamalle, Lew F.C. Lew Yan Voon, Benaissa Bellach, Olivier Aubreton, Guy Cathébras, David Navarro, Actes des Premières Rencontres des Sciences et Technologies de l'Information – ASTI'2001, pp. 138-138, France, Avril 2001
  • "Caractérisation d'un système multispectral de mesure de température", Anne-claire Legrand, Patrick Gorria, Fabrice Meriaudeau, C2I'2001 Colloque interdisciplinaire en instrumentation, 1 , pp. 291-297, Paris, Hermès, Janvier 2001
  • "Détection temps réel de points isolés: application au contrôle d'emballages de cosmétiques", Gaëtan Delcroix, Ralph Seulin, Frédéric Merienne, Patrick Gorria, Eric Fauvet, Bernard Lamalle, XVIIIème colloque national de la commission d'imagerie rapide et photonique, pp. 148-153, Paris , France, Mai 2000
  • "Eclairage dynamique pour le contrôle qualité", Ralph Seulin, Frédéric Merienne, Patrick Gorria, Journée Signal et Image pour le contrôle dans l'industrie, pp. 80-82, Le Creusot, Mai 2000
  • "Contrôle par thermographie infrarouge", Anne-claire Legrand, Fabrice Meriaudeau, Patrick Gorria, Journée Signal et Image pour le Contrôle en Industrie, pp. 51-52, Le Creusot, Mai 2000
  • "Dual wavelength infrared thermography with CCD devices", Anne-claire Legrand, Fabrice Meriaudeau, Patrick Gorria, Actes du colloque Métrologie'99, pp. 547-550, France, October 1999
  • "Contrôle par vision artficielle et transfert de technologie", Denis Aluze, Sandra Bouchard, Stéphane Charton, Gaëtan Delcroix, Pierre Geveaux, Patrick Gorria, CNRIUT'99, pp. 231-244, Aix en Provence, Juin 1999
  • "Contrôle qualité temps réel par vision artficielle", Frédéric Merienne, Patrick Gorria, Gaëtan Delcroix, Bernard Lamalle, Proc.GRAYSHM, Colloque AAA'99, pp. 134-141, Lille, Mars 1999
  • "Contrôle en ligne d’un procédé de soudage par laser Nd-Yag impulsionnel", Stéphane Charton, Yvon Voisin, Patrick Gorria, Thierry Vauzelle, Colloque interdisciplinaire en instrumentation (C2I’98) , pp. 625-632, Cachan, Hermés, Novembre 1998
  • "Application d'un capteur Cmos à l'imagerie rapide", Bernard Lamalle, Guy Cathébras, Patrick Gorria, Eric Fauvet, ANRT'98, pp. 19-23, Strasbourg, Juin 1998
  • "Caractérisation des lasers de soudage Nd : YAG pulsés", Stéphane Charton, Thierry Vauzelle, Patrick Gorria, Yvon Voisin, Journées "Club Laser de Puissance", Le Creusot, France, Avril 1998
  • "Réalisation d'un capteur d'images matricielle avec sortie numérique", Vincent Gosmain, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Sandrine Rothblez, Colloque GRETSI'97, pp. 1189-1192, Grenoble, Septembre 1997
  • "Intégration de fonctions logiques adaptées au traitement d'image dans des Fpga", Sandra Bouchard, Johel Miteran, Patrick Gorria, Vincent Juliard, Colloque CAO circuits intégrés et systèmes, Grenoble, Janvier 1997
  • "Simplification d'équations logiques en vue d'une implantation optimale sur circuits programmables", Denis Aluze, Patrick Gorria, Johel Miteran, Colloque AAA Adéquation Algorithme Architecture, Toulouse, Janvier 1996
  • "Controle dimensionnel de bains fondus par traitement d'images", Johel Miteran, Patrick Gorria, Henri Andrzewski, Seminaire GT2 du GTR134, Paris, Juin 1994
  • "Photosite spécifique pour capteur d'images de vidéo instantanée", Mourad Elloumi, Eric Fauvet, Eric Goujou, Patrick Gorria, Michel Robert, Guy Cathébras, Colloque ANRT'94, Paris, Juin 1994
  • "Caractérisation de bains fondus par apprentissage", Johel Miteran, Patrick Gorria, Henri Andrzewski, Colloque AFCET AGI'94, pp. 413-416, Poitiers, Juin 1994
  • "Contrôle temps réel par vision artificielle de tubes métalliques en défilement continu", Frédéric Truchetet, Hafid Jender, Patrick Gorria, Pascal Gérard, Journées Euro-Maghrébines de métrologie et de la qualité, Tunis, Novembre 1993
  • "Architecture programmable por l'intégration d'un classifieur géométrique", Johel Miteran, Patrick Gorria, Mourad Elloumi, Colloque CQVA'93, pp. 201-205, Le Creusot, Mai 1993
  • "Contrôle qualité sur des couvercles vissants par traitement d'images en temps réel", Patrick Gorria, Frédéric Truchetet, Michel Paindavoine, Jean Francois Kirilenko, MRT Colloque Matériaux: Science et Industrie, Paris, Juin 1992
  • "Contrôle automatique en temps réel par traitement d'images de l'état de surface de tubes métalliques", Hafid Jender, Frédéric Truchetet, Michel Paindavoine, Patrick Gorria, MRT Colloque Matériaux: Science et Industrie, Paris, Juin 1992
  • "Détection de défauts en vidéo instantanée", Michel Paindavoine, Patrick Gorria, Frédéric Truchetet, Seddik Hafdi, Jean Francois Kirilenko, XIV colloque de l'ANRT Imagerie rapide, Paris, Mars 1992
  • "Détection de défauts et traitement d'images bas niveau: classification par polytopes", Frédéric Truchetet, Patrick Gorria, Michel Paindavoine, Séminaire Sudimage Ecole Normale Supérieure ENS, Paris, Février 1992
  • "Classification géométrique par polytopes de contraintes", Patrick Gorria, Yahya Gour, Jean Midel Monnet, GRETSI'91, 13° colloque de Traitement du Signal, pp. 1129-1132, Juan les pins, Septembre 1991
  • "Système expert de vision appliqué à la détection de défauts", Patrick Gorria, Yahya Gour, Revue Industronique, pp. 50-51, Industronique, Février 1991
  • "Analyseur de faisceau laser YAG par caméra CCD", Michel Paindavoine, Frédéric Badawi, Patrick Gorria, Eric Fauvet, OPTO'90, Congrès OptoElectronique, pp. 625-631, Paris, Mai 1990
  • "Main characteristics of a high power laser beam", Frédéric Badawi, T Manderscheid, Patrick Gorria, Conférence IITT Laser 6, pp. 151-168, Paris, Avril 1990
  • "Commande des génératrices asynchrones par auto-apprentissage", Patrick Gorria, Jean Philippe Vernizeau, Revue Electronique de puissance, pp. 52-54, Octobre 1989
  • "Reconnaissance de formes par auto-apprentissage", Seddik Hafdi, Patrick Gorria, Yahya Gour, Michel Paindavoine, 21° congrès d'analyse numérique, pp. 91-92, Autruns, Mai 1989
  • "Intelligence artificielle au service de la régulation", Patrick Gorria, Jean Philippe Vernizeau, Revue Electronique Industrielle, pp. 37-39, Janvier 1989
  • "Regulation en temps réel d'une génératrice asynchrone", Patrick Gorria, Revue Electronique Industrielle, pp. 70-73, Avril 1985

Workshops internationaux (1)

  • "Automatic Texture Mapping on Real 3D Model", Thierry Molinier, David Fofi, Patrick Gorria, Joaquim Salvi, IEEE International Workshop on Projector-Camera Systems, in conjunction with CVPR'2007, Minneapolis, USA, June 2007

Workshops nationaux (2)

  • "Reconstruction 3D par images de polarisation appliquées à l’inspection de surfaces métalliques réfléchissantes", Olivier Morel, Christophe Stolz, Patrick Gorria, Journées imagerie optique non conventionnelle, Paris, France, GDR ISIS, 15 March 2005
  • "Application des images de polarisation au contrôle qualité de surfaces métalliques spéculaires", Olivier Morel, Christophe Stolz, Patrick Gorria, GDR, Imagerie Polarimétrique, Paris, France, 17 March 2004

Revues de vulgarisation (6)

  • "Adding Virtual Texture to Real Objects", Thierry Molinier, David Fofi, Patrick Gorria, Joaquim Salvi, SPIE Newsroom, SPIE, July 2009 http://spie.org/documents/Newsroom/Imported/1692/1692_6006_0_2009-07-09.pdf
  • "Caractérisation 3D de pièces en cours de forgeage à chaud", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, Revue uB Sciences de l'Université de Bourgogne, pp. 75-79, May 2009 http://193.52.240.114/lew/user_data/download/publications/2009_revue_ub_piece_de_forge.pdf
  • "La mesure laser à chaud des grandes pièces forgées", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, La forge, pp. 27-31, France, CIFORGE, April 2009
  • "Collaboration entre le laboratoire Le2i et le groupe ISMV du Laboratoire National d'Oak Ridge (ORNL), TN, USA", Fabrice Meriaudeau, Patrick Gorria, Pierrick Bourgeat, Vincent Paquit, UB Sciences, Revue annuelle de la recherche, 3 , pp. 90-93, Dijon, France, May 2008
  • "Numérisation tridimensionnelle d'objets réfléchissants par imagerie polarimétrique", Olivier Morel, Mathias Ferraton, Christophe Stolz, Fabrice Meriaudeau, Patrick Gorria, uBSciences, 2 , pp. 102-105, 25 Mai 2007 http://www.u-bourgogne.fr/upload/site_1/recherche/actualite/ubsciences_2/sc_de_la_matiere_5.pdf
  • "Masquer l'objet pour mieux le reconnaître", Lew F.C. Lew Yan Voon, Olivier Aubreton, Benaissa Bellach, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Revue de l'Université de Bourgogne, pp. 70-77, October 2005 revue_ub_retine_version_finale.pdf

CD-ROM (1)

  • "Technovision: la découverte de la vision artificielle.", Patrick Gorria, Editions Universitaires de Dijon, ISBN 2-905965-77-0, Code SODIS F28484.2 (sélection du prix Roberval 2002 catégorie multimédia), EUD, Septembre 2002 http://www.espace-technovision.com

Autres (2)

  • "TechnoVision: un centre permanent d'animations et d'activités de culture scientifique et technique", Patrick Gorria, La lettre de l'OCIM Office de coopération et d'information muséographiques ISSN 0094-1908, 87 , pp. 36-36, Mai 2003
  • "Real-Time Pattern Recognition Retina in CMOS Technology: Principle, Design, Test and Characterization", Lew F.C. Lew Yan Voon, Guy Cathébras, Bernard Lamalle, Patrick Gorria, Benaissa Bellach, Olivier Aubreton, Technical Report, Laboratory LE2I, February 2002 lew_date2002_design_contest.pdf

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