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Accueil du site > Membres > Membres Permanents > Maîtres de Conférences HdR > Lew-Fock-Chong Lew-Yan-Voon

Lew-Fock-Chong Lew-Yan-Voon

Maître de conférences - HDR

Laboratoire LE2I
IUT Le Creusot
12, rue de la Fonderie
71200 LE CREUSOT

Tél : 0385731058
Fax : 0385731099
Email : lew.lew-yan-voon u-bourgogne.fr
Web : http://193.52.240.114/lew/index.htm

Projets :


Publications

Revues (11)

  • "Single tree species classification from Terrestrial Laser Scanning data for forest inventory", Ahlem Othmani, Lew F.C. Lew Yan Voon, Christophe Stolz, Alexandre Piboule, Pattern Recognition Letters 34, 16, 2144-2150, 2013 lien sur HAL
  • "Region-based segmentation on depth images from a 3D reference surface for tree species recognition.", Ahlem Othmani, Nicolas Lomenie, Piboule Alexandre, Christophe Stolz, Lew F.C. Lew Yan Voon, IEEE International Conference on Image Processing, 0003399, 2013 lien sur HAL
  • "3D characterization of hot metallic shells during industrial forging", Youssef Bokhabrine, Ralph Seulin, Lew F.C. Lew Yan Voon, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, Journal of Machine Vision and Applications, Springer, Novembre 2010 http://www.springerlink.com/index/69370248633L7N10.pdf
  • "Towards automatic analysis of ultrasonic time-of-flight diffraction data using genetic-based Inverse Hough Transform", Khalil Maalmi, Rachid Benslimane, Lew F.C. Lew Yan Voon, Eric Fauvet, Insight - Non-Destructive Testing and Condition Monitoring Journal, 51 (4), pp. 184-191, British Institute of Non-Destructive Testing, April 2009 http://www.bindt.org/Publications/Insight_Journal/This_month%27s_Insight.html
  • "Using dithering for implementing geometric moment function estimation in a correlation retina", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Optics and spectroscopy, Vol. 101 (No. 1), pp. 3-10, Pleiades publishing, Inc., July 2006 lien sur HAL 2006_optics_and_spectroscopy.pdf
  • "A new method for implementing moment function in a CMOS retina", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Journal of Machine Vision and Applications, Vol. 16 (No. 16), pp. 384-392, Springer, February 2006 lien sur HAL 2006_mva_final.pdf
  • "CMOS image sensor for spatiotemporal image acquisition", Benaissa Bellach, Guy Cathébras, Lew F.C. Lew Yan Voon, Olivier Aubreton, Bernard Lamalle, Journal of Electronic Imaging, Vol. 15 (No. 2), pp. 020502-1-020502-3, USA, SPIE, April-June 2006 jei_020502.pdf
  • "Retina for pattern matching in standard 0.6um Complementary Metal Oxide Semiconductor technology", Olivier Aubreton, Benaissa Bellach, Lew F.C. Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Journal of Electronic Imaging - Special Issue on Quality Control by Artificial Vision, 13 (3), pp. 559-569, SPIE, July 2004
  • "100-x100- Pixel CMOS Retina for Real-Time Binary Pattern Matching", Lew F.C. Lew Yan Voon, Guy Cathébras, Bernard Lamalle, Patrick Gorria, Benaissa Bellach, Olivier Aubreton, Optical Engineering Letters, 41 (5), pp. 924-925, SPIE, May 2002 2002_oe_final_version.pdf
  • "Calibration of a 3D reconstruction system using a structured light source", Franck Marzani, Yvon Voisin, Alain Diou, Lew F.C. Lew Yan Voon, Journal of Optical Engineering, 41 (2), pp. 484-492, February 2002 mar2002a.pdf
  • "Optical correlation allows silicon retinas to recognize patterns stored in memory", Lew F.C. Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Benaissa Bellach, Fabrice Meriaudeau, David Navarro, Optical Engineering Magazine SPIE, 1 (7), pp. 32-32, July 2001

Conférences internationales (37)

  • "3D dimensional measurement of large hot metallic shells", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, Proceedings of QCAV 2009, Austria, 27 May 2009
  • "3D reconstruction of hot metallic surfaces for industrial part characterization ", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Miguel Gomez, Daniel Jobard, Proceedings of SPIE - Electronic Imaging 2009, 7251 , San Jose, USA, SPIE, 2009 2289_IE2009_yb.pdf
  • "3D LASER SYSTEM FOR SHELL DIMENSION MEASUREMENT DURING FORGING", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Miguel Gomez, Philippe Tollini, Daniel Jobard, International Forgemasters Meeting (IFM), pp. 345-348, SANTANDER, SPAIN, 2008
  • "Hardware Implementation of Moment Functions in a CMOS Retina: Application to Pattern Recognition", Olivier Aubreton, Lew F.C. Lew Yan Voon, Matthieu Nongaillard, Guy Cathébras, Cédric Lemaitre, Bernard Lamalle, Proceedings of 3rd Iberian Conference on Pattern Recognition and Image Analysis - IBPRIA'07, pp. 306-313, Girona, Spain, Springer, 6 June 2007 44770306_final_paper.pdf
  • "Hardware computation of moment functions in a silicon retina using binary patterns", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Proceedings of ICIP'2006, pp. 3293-3296, Atlanta, USA, IEEE, 8 October 2006 lien sur HAL 0003293.pdf
  • "A CMOS Retina for Zernike Moments Estimation", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Frédéric Moniot, 2005 Electronic Imaging Conference, Proc. of SPIE, Vol. 5677 , pp. 119-128, San José, USA, SPIE, 18 March 2005
  • "Hardware implementation of geometric moment functions in a CMOS retina", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Tadeusz Sliwa, Michaël Roy, Guy Cathébras, 2004 Optics East Conference, Proc. of SPIE, Vol. 5603 , pp. 225-233, 25 October 2004
  • "Application of dithering to the implemention of geometric moment functions in a correlation retina.", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Proceedings of International Meeting on Optical Sensing and Artificial Vision - OSAV04, St Pettersburg, Russia, 18 October 2004
  • "CMOS image sensor for the analysis of fast-moving luminous objects", Benaissa Bellach, Bernard Lamalle, Lew F.C. Lew Yan Voon, Guy Cathébras, ICHSPP'2002 Conference, Proceedings of SPIE, Vol. 4948 , pp. 71-76, Beaune, France, SPIE, 29 August 2003 article_beaune.pdf
  • "CMOS image sensor design for speed determination of fast moving luminous objects", Benaissa Bellach, Bernard Lamalle, Lew F.C. Lew Yan Voon, Guy Cathébras, Proceedings of SPIE - 2003 International Conference on Quality Control by Artificial Vision - QCAV'2003, Vol. 5132 , pp. 120-128, Gatlinburg, Tennessee, U.S.A., SPIE, May 2003 193_qcav2003.pdf
  • "A Correlation Retina in Standard 0.6um: Application in positioning system", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Patrick Gorria, Benaissa Bellach, 2003 International Conference on Quality Control by Artificial Vision - QCAV'2003, Proc. of SPIE, Vol. 5132 , pp. 112-119, Gatlinburg, Tennessee, USA., SPIE, May 2003 qcav03.pdf
  • "CMOS image sensor dedicated to speed determination of fast moving luminous objects", Benaissa Bellach, Bernard Lamalle, Lew F.C. Lew Yan Voon, Guy Cathébras, Proceedings of SPIE - 2003 Electronic Imaging Conference, 5017 , pp. 10-18, Santa Clara, California, U.S.A., SPIE, May 2003 spie_ei2003.pdf
  • "A Continuous Time Pattern Recognition Retina", Guy Cathébras, David Navarro, Olivier Aubreton, Benaissa Bellach, Patrick Gorria, Bernard Lamalle, Lew F.C. Lew Yan Voon, Proceedings of the 28th IEEE European Solid-State Circuits Conference - ESSCIRC'02, pp. 719-722, Florence, Italy, Septembre 2002
  • "Crack defect detection and localization using genetic based inverse voting Hough transform", Khalil Maalmi, Aziza El Ouaazizi, Rachid Benslimane, Lew F.C. Lew Yan Voon, Alain Diou, Patrick Gorria, CDROM Proceedings of 2002 International Conference on Pattern Recognition - ICPR'2002, Québec city, Québec, Canada, August 2002
  • "Detecting parabolas in ultrasound B-scan images with genetic-based inverse voting Hough transform", Khalil Maalmi, Aziza El Ouaazizi, Rachid Benslimane, Lew F.C. Lew Yan Voon, Alain Diou, Patrick Gorria, Proceedings of ICASSP'2002, IV , pp. 3337-3340, Orlando, Florida, USA, May 2002 ICASSP2002_us_1738.pdf
  • "A Pattern Recognition System based on a 100x100 Pixels Retina Fabricated in Standard 0.6 micron CMOS Technology", Olivier Aubreton, Benaissa Bellach, Guy Cathébras, Patrick Gorria, Bernard Lamalle, Lew F.C. Lew Yan Voon, Proceedings of Design, Automation and Test in Europe - DATE'2002: Designer's Forum, pp. 272-272, France, 4 March 2002
  • "A Correlation Retina for Real-Time Pattern Recognition", Bernard Lamalle, Guy Cathébras, Lew F.C. Lew Yan Voon, Patrick Gorria, Benaissa Bellach, Olivier Aubreton, Proceedings of the 2001 8th IEEE International Conference on Emerging Technologies and Factory Automation – EFTA'2001, 2 , pp. 367-372, Juan les Pins, France, Octobre 2001
  • "Optimizing the factorisation of 2D filters by genetic algorithm", Eric Fauvet, Lew F.C. Lew Yan Voon, Frédéric Nicolier, Patrick Gorria, Frédéric Truchetet, Proceedings of 2001 International IASTED Conference - Visualization, Imaging and Image Processing – VIIP'2001, pp. 676-681, Spain, September 2001
  • "Real-Time Pattern Recognition Retina in CMOS Technology", Lew F.C. Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Benaissa Bellach, David Navarro, Proceedings of the 2001 International Conference on Quality Control by Artificial Vision - QCAV'2001, 1 , pp. 238-242, Le Creusot, France, Mai 2001
  • "Silicon Retina for Real-Time Pattern Recognition", Lew F.C. Lew Yan Voon, Guy Cathébras, Benaissa Bellach, Bernard Lamalle, Patrick Gorria, Proceedings of SPIE – Electronic Imaging 2001, Sensors, Cameras, and Systems for Scientific/Industrial Applications III, 4306 , pp. 168-177, San Jose, California, USA, January 2001
  • "Active Stereovision System: A Fast and Easy Calibration Method", Franck Marzani, Yvon Voisin, Lew F.C. Lew Yan Voon, Alain Diou, CD-ROM Proceedings of the sixth International Conference on Control, Automation, Robotics and Vision – ICARCV'2000, Singapore, December 2000 ICARCV2000.pdf
  • "The Study and Design of a Programmable Silicon Retina for Real-Time Pattern Recognition", Bernard Lamalle, Patrick Gorria, Lew F.C. Lew Yan Voon, Guy Cathébras, Proceedings of SPIE/EOS Symposium on Applied Photonics - EUROPTO'2000, Optical Diagnostics for Industrial Applications, 4076 , pp. 225-234, Glasgow, Scotland, UK, May 2000
  • "Genetic algorithm application for permutations in a LUT-based FPGA", Sandra Bouchard, Xavier Vernassier, Lew F.C. Lew Yan Voon, Eric Fauvet, Alain Diou, QCAV'98, pp. 255-260, Takamatsu, Japon, November 1998
  • "Application of Digital Image Processing Techniques in Ultrasonic Inspection of Engineering Structures", Lew F.C. Lew Yan Voon, Patrice Bolland, Patrick Gorria, Eric Renier, Frédéric Truchetet, Bruno Gremillet, Luc Pillet, Proceedings of the 1998 International Conference on Quality Control by Artificial Vision - QCAV'98, pp. 521-528, Takamatsu, Kagawa, Japan, November 1998
  • "Genetic algorithm application for permutations in a LUT-based FPGA", Sandra Bouchard, Xavier Vernassier, Lew F.C. Lew Yan Voon, Eric Fauvet, Alain Diou, Proceedings of the 1998 International Conference on Quality Control by Artificial Vision - QCAV'98, pp. 255-260, Takamatsu, Kagawa, Japan, Novembre 1998
  • "Genetic algorithm optimization of numerical filters applied to a dedicated architecture", Xavier Vernassier, Eric Fauvet, Lew F.C. Lew Yan Voon, Frédéric Truchetet, Proceedings of the 1998 International Conference on Quality Control by Artificial Vision - QCAV'98, pp. 157-161, Takamatsu, Kagawa, Japan, Novembre 1998
  • "Some applications of B-Spline functions in Image processing", Alain Diou, Yvon Voisin, Lew F.C. Lew Yan Voon, G. Moreels, J. Clairemidi, Proceedings of Graphics/Vision Interface 98, pp. 325-332, Canada, Juin 1998
  • "Quelques applications des fonctions B-splines au traitement d'image", Alain Diou, Yvon Voisin, Lew F.C. Lew Yan Voon, G. Moreels, J. Clairemidi, Actes du Colloque International sur le Traitement d'Image et la Vision Artificielle (TISVA'98), pp. 197-207, Morocco, Avril 1998 tisva98.pdf
  • "Gradient based discrete Hough Transform for the detection and localization of defects during Non-Destructive inspection", Patrice Bolland, Lew F.C. Lew Yan Voon, Patrick Gorria, Bruno Gremillet, Luc Pillet, CD-ROM Proceedings of the 1997 Advanced Intelligent Mechatronics - AIM'97, Tokyo, Japan, June 1997
  • "Gradient based discrete Hough Transform for the detection and localization of defects during Non-Destructive inspection", Patrice Bolland, Lew F.C. Lew Yan Voon, Patrick Gorria, Bruno Gremillet, Luc Pillet, Proceedings of the 1997 International Conference on Quality Control by Artificial Vision - QCAV'97, pp. 287-292, France, May 1997
  • "A 3D Vision System with only one Camera", Dominique Pautet, Alain Diou, Yvon Voisin, Lew F.C. Lew Yan Voon, Proceedings of the 1997 International Conference on Quality Control by Artificial Vision - QCAV'97, pp. 303-308, France, Mai 1997
  • "A 3D Vision System with only one Camera", Dominique Pautet, Alain Diou, Yvon Voisin, Lew F.C. Lew Yan Voon, Proceedings of the 1997 International Conference on Vision Interface - VI'97, pp. 138-143, Kelowna, British Columbia, Canada, Mai 1997 VI97.pdf
  • "Gradient based Discrete Hough Transform for the Detection and Localization of Defects during Non-Destructive Inspection", Lew F.C. Lew Yan Voon, Patrice Bolland, Olivier Laligant, Patrick Gorria, Bruno Gremillet, Luc Pillet, Proceedings of the 1997 IS&T/SPIE Symposium on Electronic Imaging: Science and Technology - Image Processing Methods - Machine Vision Applications in Industrial Inspection, 3029 , pp. 140-146, San Jose, California, USA, February 1997
  • "A color image compression scheme based on psychovisual criteria", Frédéric Truchetet, Benjamin Joanne, Olivier Laligant, Lew F.C. Lew Yan Voon, Proceedings of the 5th IS&T/SID Color Conference, Color Imaging Conference, pp. 136-140, Scottsdale, Arizona, USA, Janvier 1997
  • "The application of hough transform on ultrasonic images for the detection and characterization of defects in nondestructive inspection", Patrice Bolland, Lew F.C. Lew Yan Voon, Alain Diou, Patrick Gorria, ICSP'96, IEEE third int. conf. on Signal Processing, pp. 393-396, Bengin, Chine, October 1996
  • "A neural network approach to geometrical classification by stress polytopes", Patrice Bolland, Johel Miteran, Lew F.C. Lew Yan Voon, Patrick Gorria, QCAV'95, pp. 134-140, Le Creusot, May 1995
  • "Simulation of an optical sensor in Cmos technology", Bernard Lamalle, Patrick Gorria, Lew F.C. Lew Yan Voon, Eric Goujou, QCAV'95, pp. 293-299, Le Creusot, May 1995

Conférences nationales (9)

  • "Identification des espèces d'arbres à partir de données T-LiDAR Tree species identification using T-LiDAR data", Ahlem Othmani, Christophe Stolz, Lew F.C. Lew Yan Voon, Alexandre Piboule, Orasis 2013, cluny : France, 2013 lien sur HAL
  • "Application de la décomposition modale empirique à l'étude des signaux cardiaques", Ouadi Beya, Bushra Jalil, Eric Fauvet, Olivier Laligant, Lew F.C. Lew Yan Voon, CNRIUT09, 2009 http://cnriut09.univ-lille1.fr/articles/Articles/Fulltext/194a.pdf
  • "Capteur numérique d'images dédié à la mesure de vitesse de phénomènes lumineux", Benaissa Bellach, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, Actes du colloque READ'2005, pp. 119-125, INT, Evry, France, 1 Juin 2005 read05_bbellach.pdf
  • "Masques binaires pour reconnaissance de forme", Olivier Aubreton, Guy Cathébras, Bernard Lamalle, Lew F.C. Lew Yan Voon, Cédric Lemaitre, Actes du colloque READ05, pp. 83-88, Evry, France, 1 Juin 2005 70read05.pdf
  • "Application d’un algorithme de dithering pour une implantation de moments géométriques dans une rétine CMOS", Olivier Aubreton, Lew F.C. Lew Yan Voon, Bernard Lamalle, Guy Cathébras, 5ème colloque francophone du club Contrôle et Mesure Optique pour l’Industrie, Méthodes et Techniques Optiques pour l’Industrie, session poster, Saint Etienne, France, 15 November 2004
  • "CCD or CMOS which choice for the futur?", Olivier Aubreton, Bernard Lamalle, Lew F.C. Lew Yan Voon, Benaissa Bellach, Prooceedings of the 2003 Workshop on "Vision, Image et Agriculture" - VIA'2003, France, Janvier 2003
  • "Traitement d'images: La solution rétines CMOS", Olivier Aubreton, Benaissa Bellach, Bernard Lamalle, Guy Cathébras, Patrick Gorria, Lew F.C. Lew Yan Voon, Actes de CNRIUT'2002, pp. 71-76, France, Avril 2002
  • "Rétine vidéo rapide réalisée en technologie CMOS", Benaissa Bellach, Olivier Aubreton, Bernard Lamalle, Lew F.C. Lew Yan Voon, Guy Cathébras, Patrick Gorria, Proceedings of 2002 Journées Nationales du Réseau Doctoral de Microélectronique - JNRDM'2002, pp. 211-212, France, Avril 2002
  • "Reconnaissance de formes en temps réel", Patrick Gorria, Bernard Lamalle, Lew F.C. Lew Yan Voon, Benaissa Bellach, Olivier Aubreton, Guy Cathébras, David Navarro, Actes des Premières Rencontres des Sciences et Technologies de l'Information – ASTI'2001, pp. 138-138, France, Avril 2001

Revues de vulgarisation (3)

  • "Caractérisation 3D de pièces en cours de forgeage à chaud", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, Revue uB Sciences de l'Université de Bourgogne, pp. 75-79, May 2009 http://193.52.240.114/lew/user_data/download/publications/2009_revue_ub_piece_de_forge.pdf
  • "La mesure laser à chaud des grandes pièces forgées", Youssef Bokhabrine, Lew F.C. Lew Yan Voon, Ralph Seulin, Patrick Gorria, Gouenou Girardin, Miguel Gomez, Daniel Jobard, La forge, pp. 27-31, France, CIFORGE, April 2009
  • "Masquer l'objet pour mieux le reconnaître", Lew F.C. Lew Yan Voon, Olivier Aubreton, Benaissa Bellach, Bernard Lamalle, Patrick Gorria, Guy Cathébras, Revue de l'Université de Bourgogne, pp. 70-77, October 2005 revue_ub_retine_version_finale.pdf

Autres (3)

  • "Towards automated and operational forest inventories with T-Lidar", Ahlem Othmani, Alexandre Piboule, Christophe Stolz, Lew F.C. Lew Yan Voon, SilviLaser 2011, 16 Octobre 2011 lien sur HAL
  • "A CMOS image sensor design for speed determination of fast moving luminous objects", Benaissa Bellach, Bernard Lamalle, Lew F.C. Lew Yan Voon, Guy Cathébras, Society of Manufacturing Engineers (SME) Technical papers, MV03-254 , pp. 120-128, USA, SME, 2003
  • "Real-Time Pattern Recognition Retina in CMOS Technology: Principle, Design, Test and Characterization", Lew F.C. Lew Yan Voon, Guy Cathébras, Bernard Lamalle, Patrick Gorria, Benaissa Bellach, Olivier Aubreton, Technical Report, Laboratory LE2I, February 2002 lew_date2002_design_contest.pdf

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